Title

Generalization of an Outlier Model into a "Global" Perspective

Published In

2015 IEEE International Test Conference

Document Type

Citation

Publication Date

10-2015

Subjects

Outliers (Statistics), Automobiles -- Electronic equipment, Semiconductors -- Measurement

Abstract

n this work, we study the generalization of an outlier model from two perspectives, temporal and spatial. We show that model generalization with existing distribution-based outlier analysis methods can vary significantly. We then propose a “big data” outlier analysis approach together with a probability-based outlier evaluation for improving model generalization. Experiments are conducted based on two automotive product lines to explain the concepts and demonstrate the effectiveness of the proposed approach.

Description

Appeared in 2015 IEEE International Test Conference, held Oct. 6-8, 2015, in Anaheim, CA. © Copyright 2016 IEEE - All rights reserved.

Locate the Document

PSU Library affiliates use Find in PSU library link at top.

Unaffiliated researchers can access the work here: http://dx.doi.org/10.1109/TEST.2015.7342396

DOI

10.1109/TEST.2015.7342396

Persistent Identifier

http://archives.pdx.edu/ds/psu/16645

Share

COinS