Title

Delay and Yield of CNFET-Based Circuits in the Presence of Variations

Published In

2015 IEEE Nanotechnology Materials and Devices Conference (NMDC)

Document Type

Citation

Publication Date

9-2015

Abstract

The aggressive scaling of CMOS circuits is approaching the atomic and quantum physical limits [1], and therefore extensive research is being conducted on devices made with III-V and II-VI semiconductors, and with more exotic materials like grapheme, and various nanotubes.

DOI

10.1109/NMDC.2015.7439255

Persistent Identifier

http://archives.pdx.edu/ds/psu/19204

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