Consistency in Wafer Based Outlier Screening
VLSI Test Symposium (VTS), 2016 IEEE 34th
Outlier screening is a popular approach for testing automotive products. In practice, developing an outlier model can be subjective, making justification of the model challenging. In this paper we propose a new concept called Consistency which provides a data-driven objective way to assess an outlier model. We study the development of outlier models in view of this new model consistency concept and report experimental findings on an automotive product line.
Locate the Document
S. Siatkowski, C. J. Shan, L. C. Wang, N. Sumikawat, W. R. Daasch and J. M. Carulli, "Consistency in wafer based outlier screening," 2016 IEEE 34th VLSI Test Symposium (VTS), Las Vegas, NV, 2016, pp. 1-6.