Document Type

Post-Print

Publication Date

2015

Subjects

Technological innovations -- Management, Data envelopment analysis, Decision making -- Mathematical models

Abstract

In this paper, we propose a technology trajectory mapping approach using Data Envelopment Analysis (DEA) that scrutinizes technology progress patterns from multidimensional perspectives. Literature reviews on technology trajectory mappings have revealed that it is imperative to identify key performance measures that can represent different value propositions and then apply them to the investigation of technology systems in order to capture indications of the future disruption. The proposed approach provides a flexibility not only to take multiple characteristics of technology systems into account but also to deal with various tradeoffs among technology attributes by imposing weight restrictions in the DEA model. The application of this approach to the flat panel technologies is provided to give a strategic insight for the players involved.

Description

This is the author’s version of a work that was accepted for publication in R&D Management. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication.

A definitive version was subsequently published in R&D Management and is available online at: http://dx.doi.org/10.1111/radm.12111

There is a 2 year embargo on this work

DOI

10.1111/radm.12111

Persistent Identifier

http://archives.pdx.edu/ds/psu/12758

Included in

Engineering Commons

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