Subjects
Quantum theory, Quantum computers, Machine theory
Abstract
This work extends a general method used to test classical circuits to quantum circuits. Gate internal errors are address using a discrete fault model. Fault models to represent unwanted nearest neighbor entanglement as well as unwanted qubit rotation are presented. When witnessed, the faults we model are probabilistic, but there is a set of tests with the highest probability of detecting a discrete repetitive fault. A method of probabilistic set covering to identify the minimal set of tests is introduced. A large part of our work consisted of writing a software package that allows us to compare various fault models and test strategies for quantum networks.
Faculty Mentor: Marek A. Perkowski
DOI
10.15760/mcnair.2005.38
Creative Commons License
This work is licensed under a Creative Commons Attribution-NonCommercial-Share Alike 4.0 International License.
Persistent Identifier
http://archives.pdx.edu/ds/psu/8727
Recommended Citation
Biamonte, Jacob D.
(2004)
"Automated Test Pattern Generation for Quantum Circuits,"
PSU McNair Scholars Online Journal:
Vol. 1:
Iss.
1, Article 3.
https://doi.org/10.15760/mcnair.2005.38