Demonstration of 40kV Diffraction of Graphite for Structural Analysis
Microscopy and Microanalysis
Graphite -- Testing
Rapid structural assessment of newly synthesized nanomaterials is of tantamount importance both to exploratory researchers and industries seeking integration with consumer products. Most nanomaterials are susceptible to radiation damage during observation in the transmission electron microscope (TEM), causing propagation of dislocations, altering crystal phases, and destruction of the lattice structure through amorphization. Lowering the observation voltage in the TEM can result in less damage, though at the expense of decreased resolution, for many nanomaterials . For microscopes not equipped with aberration correctors, such as the Tecnai F20 used here, an information space roughly equivalent to 200kV operation can be achieved at 40kV through diffraction, greatly increasing the length of time for observation and the certainty of the observed structural details.
Barnum, A., & Jiao, J. (2015). Demonstration of 40kV TEM Diffraction of Graphite for Structural Analysis. Microscopy and Microanalysis, 21(S3), 353-354.