Sponsor
Portland State University. Department of Physics
First Advisor
Rolf Könenkamp
Date of Publication
Winter 3-9-2015
Document Type
Dissertation
Degree Name
Doctor of Philosophy (Ph.D.) in Physics
Department
Physics
Language
English
Subjects
Electron microscopy, Photoemission, Aberration, Optical wave guides, Electron optics
DOI
10.15760/etd.2190
Physical Description
1 online resource (vii, 263 pages)
Abstract
Photoemission electron microscopy (PEEM) uses photoelectrons excited from material surfaces by incident photons to probe the interaction of light with surfaces with nanometer-scale resolution. The point resolution of PEEM images is strongly limited by spherical and chromatic aberration. Image aberrations primarily originate from the acceleration of photoelectrons and imaging with the objective lens and vary strongly in magnitude with specimen emission characteristics. Spherical and chromatic aberration can be corrected with an electrostatic mirror, and here I develop a triode mirror with hyperbolic geometry that has two adjacent, field-adjustable regions. I present analytic and numerical models of the mirror and show that the optical properties agree to within a few percent. When this mirror is coupled with an electron lens, it can provide a large dynamic range of correction and the coefficients of spherical and chromatic aberration can be varied independently. I report on efforts to realize a triode mirror corrector, including design, characterization, and alignment in our microscope at Portland State University (PSU). PEEM may be used to investigate optically active nanostructures, and we show that photoelectron emission yields can be identified with diffraction, surface plasmons, and dielectric waveguiding. Furthermore, we find that photoelectron micrographs of nanostructured metal and dielectric structures correlate with electromagnetic field calculations. We conclude that photoemission is highly spatially sensitive to the electromagnetic field intensity, allowing the direct visualization of the interaction of light with material surfaces at nanometer scales and over a wide range of incident light frequencies.
Rights
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Persistent Identifier
http://archives.pdx.edu/ds/psu/14570
Recommended Citation
Fitzgerald, Joseph P. S., "Aberration Corrected Photoemission Electron Microscopy with Photonics Applications" (2015). Dissertations and Theses. Paper 2192.
https://doi.org/10.15760/etd.2190