First Advisor

Sung Yi

Term of Graduation

Summer 2024

Date of Publication

9-4-2024

Document Type

Dissertation

Degree Name

Doctor of Philosophy (Ph.D.) in Mechanical Engineering

Department

Mechanical and Materials Engineering

Language

English

Physical Description

1 online resource (x,117 pages)

Abstract

The present study uses the finite element method to evaluate the fatigue life of solder joints of plastic ball grid array packages (PBGA) under thermal-cycling conditions. A Series of precise 3D FE models for solder joints of plastic ball grid array packages is created to improve reliability prediction accuracy. Damage parameters are obtained from the FEA results and used to estimate solder balls’ thermal fatigue life. The Coffin-Manson equation is employed. The predicted thermal fatigue lives are discussed in detail.

Due to marketing and legislative pressures, Pb-free solder is fast becoming a reality in electronic manufacturing. The industry has concluded that various versions of SnAgCu solder alloy offer the best alternative for eutectic SnPb solder. With the current trend of cheaper, faster, and better electronic equipment, evaluating the package and system performance very early in the design cycle using simulation tools has become increasingly important. This requires life prediction models for new solder alloy systems to predict package-to-board interconnect reliability for various environmental and field conditions.

This paper introduces an FEA modeling technique that produces acceptable and reliable results in the fatigue life prediction of solder balls. Also, the fatigue life of two different Pb-free solders and two different traditional SnPb solders will be compared. It also describes the life prediction process of solder joints in a real-life package.

The approach in this study uses advanced finite element modeling and analysis techniques based on deformation mechanics. Both accumulated creep strain and creep Strain energy density-based models are developed.

Rights

© 2024 Hamidreza Nahavandi

In Copyright. URI: http://rightsstatements.org/vocab/InC/1.0/ This Item is protected by copyright and/or related rights. You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you need to obtain permission from the rights-holder(s).

Persistent Identifier

https://archives.pdx.edu/ds/psu/42525

FatigueResults.xlsx (7878 kB)
Fatigue Results

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