Residual images in charged-coupled device detectors

Authors

Armin RestFollow
Lars Mündermann
Ralf Widenhorn, Portland State UniversityFollow
Erik Bodegom, Portland State UniversityFollow
T. C. McGlinn

Published In

Review of Scientific Instruments

Document Type

Article

Publication Date

5-1-2002

Subjects

Charge coupled devices, Electric currents -- Measurement, Image processing -- Digital techniques

Abstract

We present results of a systematic study of persistent, or residual, images that occur in charged-coupled device (CCD) detectors. A phenomenological model for these residual images, also known as "ghosting," is introduced. This model relates the excess dark current in a CCD after exposure to the number of filled impurity sites which is tested for various temperatures and exposure times. We experimentally derive values for the cross section, density, and characteristic energy of the impurity sites responsible for the residual images.

Description

This is the publisher's final pdf. Article appears in Review of Scientific Instruments (http://rsi.aip.org/) and is copyrighted (2002) by the American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

DOI

10.1063/1.1470234

Persistent Identifier

http://archives.pdx.edu/ds/psu/9241

Citation Details

"Residual images in charged-coupled device detectors," with R. Widenhorn, L. Mündermann, A. Rest, T.C. NcGlinn, Rev. Scient. Instr. 73, 2028 (2002)