Published In

Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 1

Document Type

Article

Publication Date

2006

Subjects

Transmission electron microscopy -- Technique, Crystallography -- Databases, Nanocrystals

Abstract

A brief introduction to lattice fringe fingerprinting in two dimensions (2D) with database support is given. The method is employed for the identification of the crystal phase of a small ensemble of nanocrystals. The enhanced viability of this method in aberration-corrected transmission electron microscopes (TEMs) and scanning TEMs (STEMs) is also illustrated.

Description

Originally presented at the 2006 NSTI Nanotechnology Conference and Trade Show and included in its technical proceedings. © Nano Science and Technology Institute

Version of record may be found at http://www.nsti.org/procs/Nanotech2006v1/8/W61.102.

Persistent Identifier

http://archives.pdx.edu/ds/psu/16071

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