Published In
Zeitschrift für Kristallographie
Document Type
Article
Publication Date
2009
Subjects
Electrons -- Diffraction, Transmission electron microscopes, Crystallography, Nanocrystals
Abstract
The foundations of precession electron diffraction in a transmission electron microscope are outlined. A brief illustration of the fact that laboratory-based powder X-ray diffraction fingerprinting is not feasible for nanocrystals is given. A procedure for structural fingerprinting of nanocrystals on the basis of structural data that can be extracted from precession electron diffraction spot patterns is proposed.
DOI
10.1524/zkri.2010.1162
Persistent Identifier
http://archives.pdx.edu/ds/psu/16080
Citation Details
Moeck, Peter, and Sergei Rouvimov. "Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope." Zeitschrift für Kristallographie International journal for structural, physical, and chemical aspects of crystalline materials 225, no. 2-3 (2010): 110-124.
Description
Originally appeared in Zeitschrift für Kristallographie, volume 225, number 2-3, and can be found at DOI: 10.1524/zkri.2010.1162