Theoretical Estimates of Spherical and Chromatic Aberration in Photoemission Electron Microscopy

Authors

Joseph P. S. Fitzgerald, Portland State UniversityFollow
Robert Campbell Word, Portland State UniversityFollow
Rolf Kӧnenkamp, Portland State UniversityFollow

Published In

Ultramicroscopy

Document Type

Post-Print

Publication Date

1-2016

Subjects

Photoelectron spectroscopy, Chromatic aberration (Optics), Electron optics

Abstract

We present theoretical estimates of the mean coefficients of spherical and chromatic aberration for low energy photoemission electron microscopy (PEEM). Using simple analytic models, we find that the aberration coefficients depend primarily on the difference between the photon energy and the photoemission threshold, as expected. However, the shape of the photoelectron spectral distribution impacts the coefficients by up to 30%. These estimates should allow more precise correction of aberration in PEEM in experimental situations where the aberration coefficients and precise electron energy distribution cannot be readily measured.

Description

This is the post-print version of an article which was subsequently published in Ultramicroscopy. Copyright (2016) Elsevier.

Version of record can be be found at:

http://dx.doi.org/10.1016/j.ultramic.2015.10.023

DOI

10.1016/j.ultramic.2015.10.023

Persistent Identifier

http://archives.pdx.edu/ds/psu/17725

Citation Details

Fitzgerald, Joseph P. S.; Word, Robert Campbell; and Kӧnenkamp, Rolf, "Theoretical Estimates of Spherical and Chromatic Aberration in Photoemission Electron Microscopy" (2016). Physics Faculty Publications and Presentations. 252.
http://archives.pdx.edu/ds/psu/17725