Aberration Correction in Photoemission Microscopy and Applications in Photonics and Plasmonics

Document Type

Technical Report

Publication Date

9-2017

Subjects

Nanotechnology, Materials science, Electron microscopy, Photonics, Plasmonics

Abstract

We report on the design, assembly, operation and application of an aberration-corrected photoemission electron microscope. The instrument used novel hyperbolic mirror-correctors with two and three electrodes that allowed simultaneous correction of spherical and chromatic aberrations. A spatial resolution of 5.4nm was obtained with this instrument in 2009, and 4.7nm in subsequent years. New imaging methodology was introduced involving interferometric imaging of light diffraction. This methodology was applied in nano-photonics and in the characterization of surface-plasmon polaritons. Photonic crystals and waveguides, optical antennas and new plasmonic devices such as routers, localizers and filters were designed and demonstrated using the new capabilities offered by the microscope.

Description

Final project report DOE grant DE-FG02-07ER46406 (2007-2017)

DOI

10.2172/1395725

Persistent Identifier

https://archives.pdx.edu/ds/psu/30314

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