Published In
Optics Letters
Document Type
Article
Publication Date
4-1-1993
Subjects
Liquid films, Amorphous semiconductors, Silicon alloys
Abstract
The temperature dependence of the optical properties for amorphous silicon is studied at wavelengths of 632.8 and 752 nm. Both the refractive index and extinction coefficient increase linearly with temperature for 752 nm, while the refractive index decreases and the extinction coefficient increases for 632.8 nm. The rate of increase of the extinction coefficient at 632.8 nm is twice as much as that for 752 nm.
DOI
10.1364/OL.18.000540
Persistent Identifier
http://archives.pdx.edu/ds/psu/7715
Citation Details
Yavas, O., Do, N., Tam, A., Leung, P., Leung, W., Park, H., & ... Leiderer, P. (1993). Temperature dependence of optical properties for amorphous silicon at wavelengths of 632.8 and 752 nm. Optics Letters, 18(7), 540-542.
Description
This paper was published in Optics Letters and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OL.18.000540. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.