Published In
Applied Physics Letters
Document Type
Article
Publication Date
12-1-2005
Subjects
Energy dissipation, Conservation laws (Physics)
Abstract
The dissipative and conservative interactions between a sharp probe and a flat Si sample in the ultrasonic/shear-force microscope are investigated. It is shown that, when working in the ambient condition, there are two distinct probe-sample interaction regions: the pure dissipative interaction region in the relatively far probe-sample distance, and the highly correlated dissipative and conservative interaction region in the close probe-sample distance. The ultrasonic data suggest that the phonon generation is a dissipative channel for the probe-sample interaction in the shear force microscope. A shaking potential model is proposed to explain the phononic friction mechanism
DOI
10.1063/1.2138793
Persistent Identifier
http://archives.pdx.edu/ds/psu/7319
Citation Details
Cui, X., & La Rosa, A. (2005). Investigation of the probe-sample interaction in the ultrasonic/shear-force microscope: The phononic friction mechanism. Applied Physics Letters, 87(23), 231907.
Description
Article appears in Applied Physics Letters (http://apl.aip.org/) and is copyrighted (2005) by the American Institute of Physics, and can be found at: http://dx.doi.org/10.1063/1.2138793. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.