Statistical Model of OFDM and its Application in Nonlinearity Analysis of LTE-Advanced Systems
International Journal of Electronics Letters
In this letter, to study the nonlinearity of RF power amplifiers (PAs), we showed that LTE-Advanced signals with large number of subcarriers can be expressed as a white Gaussian noise statistical model with flat power spectrum. This characteristic enables us to express the spectrum regrowth of LTE-Advanced signals up to an arbitrarily high order in an explicit form, in terms of the traditional PA nonlinearity parameter intercept points without complicated convolution. This general analytic expression would help RF designers to predict the PA distortion with simple intercept point expression, and provide insight for pre-distortion.
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Xiao Li, Kwok-Wai Tam, and Fu Li. Statistical model of OFDM and its application in nonlinearity analysis of LTE-advanced systems. International Journal of Electronics Letters, pages 1–6, May 2015.