Advisor

W. Robert Daasch

Date of Award

1988

Document Type

Thesis

Degree Name

Master of Science (M.S.) in Electrical and Computer Engineering

Department

Electrical and Computer Engineering

Physical Description

1 online resource (91 p.)

Subjects

Electric resistance -- Mathematical models, Metal oxide semiconductors -- Mathematical models

DOI

10.15760/etd.5686

Abstract

The voltage controlled resistance model is developed for a reliable MOS transistor resistance mapping. The model includes both system and local parameters, and incorporates the effect of rise and fall time variations on the gate delay. MOS transistor resistance mapping is applied in logic simulation and timing verification. Also, it can be used in automatic transistor sizing and critical path analysis.

Description

If you are the rightful copyright holder of this dissertation or thesis and wish to have it removed from the Open Access Collection, please submit a request to pdxscholar@pdx.edu and include clear identification of the work, preferably with URL

Persistent Identifier

http://archives.pdx.edu/ds/psu/21270

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