First Advisor

W. Robert Daasch

Date of Publication

1988

Document Type

Thesis

Degree Name

Master of Science (M.S.) in Electrical and Computer Engineering

Department

Electrical Engineering

Language

English

Subjects

Electric resistance -- Mathematical models, Metal oxide semiconductors -- Mathematical models

DOI

10.15760/etd.5686

Physical Description

1 online resource (91 p.)

Abstract

The voltage controlled resistance model is developed for a reliable MOS transistor resistance mapping. The model includes both system and local parameters, and incorporates the effect of rise and fall time variations on the gate delay. MOS transistor resistance mapping is applied in logic simulation and timing verification. Also, it can be used in automatic transistor sizing and critical path analysis.

Rights

In Copyright. URI: http://rightsstatements.org/vocab/InC/1.0/ This Item is protected by copyright and/or related rights. You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you need to obtain permission from the rights-holder(s).

Comments

If you are the rightful copyright holder of this dissertation or thesis and wish to have it removed from the Open Access Collection, please submit a request to pdxscholar@pdx.edu and include clear identification of the work, preferably with URL

Persistent Identifier

http://archives.pdx.edu/ds/psu/21270

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