Sponsor
This work was supported by the Army Research Office Grants DAAH04-94-G-0156 and DAAH04-93-G-0194.
Published In
Applied Physics Letters
Document Type
Article
Publication Date
8-1-1995
Subjects
Near-field microscopy, Optical fibers
Abstract
An aluminum-coated tapered fiber probe, as used in near-field scanning optical microscopy (NSOM), is heated by the light coupled into it. This can destroy the probe or may modify the sample, which can be problematic or used as a tool. To study these thermal effects, we couple modulated visible light of various power through probes. Simultaneously coupled infrared light senses the thermal effects. We report their magnitude, their spatial and temporal scales, and real-time probe damage observations.Amodel describes the experimental data, the mechanisms for induced IR variation, and their relative importance.
DOI
10.1063/1.115143
Persistent Identifier
http://archives.pdx.edu/ds/psu/7557
Citation Details
La Rosa, A. H., Yakobson, B. I., & Hallen, H. D. (1995). Origins and effects of thermal processes on near-field optical probes. Applied Physics Letters, 67(18), 2597.
Description
Article appears in Applied Physics Letters (http://apl.aip.org/) and is copyrighted (1995) by the American Institute of Physics, and can be found at: http://dx.doi.org/10.1063/1.115143. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.