Plasmons (Physics), Surface plasmon resonance, Nanostructures -- Optical properties
It is demonstrated that ultrahigh-resolution angular measurement can be achieved via surface-plasmon-resonance excitation in which the phase difference between p- and s-polarized reflected waves is monitored as a function of the incidence angle. Resolutions down to 1.9 x 10(-6) deg are obtained by performing the measurements at optimal incident wavelengths. This represents an order of magnitude improvement compared with previously reported values.
Chiang, H., Lin, J., Chang, R., Su, S., & Leung, P. (2005). High-resolution angular measurement using surface-plasmon-resonance via phase interrogation at optimal incident wavelengths. Optics Letters, 30(20), 2727-2729.