Published In

Physical Review B

Document Type

Article

Publication Date

5-21-2014

Subjects

Photoelectric emission, Waveguides, Thin films -- Surfaces, Photoemission

Abstract

We report the visualization and quantitative analysis of electromagnetic surface fields at solid surfaces with the potential for λ/50 resolution. To illustrate this capability, we investigate patterns in two-photon photoemission images of light-diffracting structures in waveguiding, transparent thin films. The obtained micrographs show interference patterns between incident and guided light with a remarkable sensitivity to subwavelength features. We demonstrate that photoemission rates are directly related to the surface field strengths and develop a subwavelength method to calculate the surface fields from optical properties and surface topology based on the two-dimensional Kirchhoff diffraction integral. Calculated images based on this theoretical approach compare favorably to experimental electron micrographs.

Rights

© 2014 American Physical Society

Description

This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Physical Review B, 89(19), 195129 and may be found at https://doi.org/10.1103/PhysRevB.89.195129

DOI

10.1103/PhysRevB.89.195129

Persistent Identifier

http://archives.pdx.edu/ds/psu/11928

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