Sponsor
This research was supported partly by the US-DOE Basic Science Office under Contract No. DE-FG02-10ER46406.
Published In
Ultramicroscopy
Document Type
Post-Print
Publication Date
12-1-2017
Subjects
Electron microscopy, Nanoparticles
Abstract
Using photoemission electron microscopy (PEEM) we present a comparative analysis of the wavelength dependence of propagating fields in a simple optical slab waveguide and a thin film photonic crystal W1-type waveguide. We utilize an interferometric imaging approach for light in the near-ultraviolet regime where a 2-photon process is required to produce photoelectron emission. The typical spatial resolution in these experiments is < 30 nm. Electromagnetic theory and finite element simulations are shown to be in good agreement with the experimental observations. Our results indicate that multiphoton PEEM is a useful sub-wavelength characterization technique in thin film optics.
Rights
© 2017 Elsevier B.V. All rights reserved.
Locate the Document
DOI
10.1016/j.ultramic.2017.06.013
Persistent Identifier
http://archives.pdx.edu/ds/psu/23942
Citation Details
Published as: Stenmark, T., Word, R. C., & Könenkamp, R. (2017). Confined photonic mode propagation observed in photoemission electron microscopy. Ultramicroscopy, 183, 38-42.
Description
This is the author’s version of a work that was accepted for publication in Ultramicroscopy. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Ultramicroscopy,183:38-42.