Crystallite Thickness Estimates From Precession Electron Diffraction Patterns For Structural Fingerprinting In The Quasi-Kinematic Limit

Authors

Peter Moeck, Portland State UniversityFollow
Jack C. Straton, Portland State UniversityFollow
Sergei Rouvimov, Portland State UniversityFollow
I. Haeusler, Humboldt University of Berlin,

Published In

Microscopy and Microanalysis

Document Type

Citation

Publication Date

7-1-2012

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Description

Copyright 2012 Microscopy Society of America

Locate the Document

https://doi.org/10.1017/S1431927612004667

DOI

10.1017/S1431927612004667

Persistent Identifier

https://archives.pdx.edu/ds/psu/25895

Citation Details

Moeck, P., Straton, J., Rouvimov, S., & Haeusler, I. (2012). Crystallite Thickness Estimates from Precession Electron Diffraction Patterns for Structural Fingerprinting in the Quasi-kinematic Limit. Microscopy and Microanalysis, 18(S2), 562-563.