Published In
Physical Review B
Document Type
Article
Publication Date
2019
Subjects
Electron microscopy, Nanoparticles
Abstract
Using femtosecond nonlinear photoemission electron microscopy (PEEM) we provide a detailed characterization of slow light in a small-size asymmetric photonic crystal structure. We show that PEEM is capable of providing a unique description of the light propagation in such structures by direct imaging of the guided mode. This noninvasive characterization technique allows modal properties such as effective index, phase velocities, and group velocities to be determined. Combining experimental results with finite element method simulation calculations, we study slow light phenomena in a photonic crystal defect mode, and we produce a comprehensive picture of the mechanisms behind it. Our results illustrate the usefulness of electron microscopy in exploring nano-optical applications.
Rights
©2019 American Physical Society
Locate the Document
DOI
10.1103/PhysRevB.99.205428
Persistent Identifier
https://archives.pdx.edu/ds/psu/28867
Citation Details
Stenmark, T., & Könenkamp, R. (2019). Photoemission electron microscopy to characterize slow light in a photonic crystal line defect. Physical Review B, 99(20), 205428.
Description
This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Journal of Physical Review B, 99(20), 205428 and may be found at https://doi.org/10.1103/PhysRevB.99.205428