High-Resolution Angular Measurement Using Surface-Plasmon-Resonance via Phase Interrogation at Optimal Incident Wavelengths

Authors

Hai-Pang Chiang, National Taiwan Ocean University
Jing-Lun Lin, National Taiwan Ocean University
Railing Chang, National Taiwan Ocean UniversityFollow
Sheng-Yu Su, National Taiwan Ocean University
P.T. Leung, Portland State UniversityFollow

Published In

Optics Letters

Document Type

Article

Publication Date

10-1-2005

Subjects

Plasmons (Physics), Surface plasmon resonance, Nanostructures -- Optical properties

Abstract

It is demonstrated that ultrahigh-resolution angular measurement can be achieved via surface-plasmon-resonance excitation in which the phase difference between p- and s-polarized reflected waves is monitored as a function of the incidence angle. Resolutions down to 1.9 x 10(-6) deg are obtained by performing the measurements at optimal incident wavelengths. This represents an order of magnitude improvement compared with previously reported values.

Rights

© 2005 Optical Society of America

Description

This paper was published in Optics Letters and is made available as an electronic reprint with the permission of OSA.

The paper can be found at the following URL on the OSA website: https://doi.org/10.1364/OL.30.002727.

Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

DOI

10.1364/OL.30.002727

Persistent Identifier

http://archives.pdx.edu/ds/psu/7716

Citation Details

Chiang, H., Lin, J., Chang, R., Su, S., & Leung, P. (2005). High-resolution angular measurement using surface-plasmon-resonance via phase interrogation at optimal incident wavelengths. Optics Letters, 30(20), 2727-2729.