Management of Engineering and Technology
Nanoelectronics, Metrology, Technology -- Research, Nanomanufacturing, Technology -- Management
The vast development of nanotechnology requires a way to measure the quality of products, either in production or in research development. The size of the matter that is being dealt with is decreasing over time. There are many challenges that are faced by the metrology tool makers in developing their own roadmap. The challenges come from two different aspects of the business, the customers’ requirements and the metrology tool company’s development. In this paper, we discuss requirements from three different industries: nanoelectronics, nanofabrication, and nanomanufacturing. The main requirements from these industries may be similar but the metrology tool companies must be able to be flexible to capture and deliver other requirements specific to the industry or the customer.
Another challenge is from within the metrology tool company itself. There are many challenges in obtaining the required funding for the scientist to develop new technology and in product development cycle of the metrology tools. The product development process is created in this paper, with information from interview with a scientist from one of metrology tool makers in the US.
We recommended that the three-joint interest among the academia, government and industries must be developed to support technology research and development for metrology tools. The metrology tool companies must perform technology push and obtain market pull information for new breakthrough technologies and new features in the tools. The company must ensure that the technology and business roadmap is following the customers’ and the nanotechnology industries’ roadmap. That way, the company can be ahead of the competition and deliver the customers’ requirements.
We also recommended that the technology managers must have strong leadership skills to bring the resources together and used their capabilities to achieve company’s goals and objectives. The leader may not be technically savvy, but he/she must look at a bigger picture of leading the company.
Taha, Rimal Abu; Ajay, Tudi; Al-Ali, Baqer; Aldraihem, Ahmed; and Wahyuni, Ferra, "Challenges in Development of Metrology Tools for Nanotechnology" (2006). Engineering and Technology Management Student Projects. 1217.