Presentation Type
Poster
Start Date
5-8-2024 11:00 AM
End Date
5-8-2024 1:00 PM
Subjects
Photoemission, Physics
Advisor
Erik Sánchez
Student Level
Doctoral
Abstract
With the advancement of technology, people are pursuing even higher-resolution analysis results from metrology tools. When results are provided with temporal information, one can add a new dimension to the results. This research involves the development of a new temporal electron source by utilizing tip enhancement, which necessitates the creation of a novel type of emitter that emits electrons on a femtosecond (fs) time scale. Due to the nature of the electron’s mass, under the influence of an electric field they move quickly. To achieve our goal is the design of a resonant nano antenna (or known as a nantenna) to produce field enhanced photoelectron emission. The benefits from this design include less damage (much less than 1 nJ) to the tip from the laser and a much smaller region of emission, if successful. This work will require knowledge of ultra-high vacuum systems, electron microscope usage and modification, ultra-fast lasers (alignment and mode-locking), Focused Ion Beam (FIB) milling at a high-resolution level, FDTD modeling of probe tips on the nanoscale, as well as many other techniques.
Persistent Identifier
https://archives.pdx.edu/ds/psu/41712
Included in
Toward The Development Of An Ultra-Fast, Bright Photoelectron Emission Source Using Tip Enhancement
With the advancement of technology, people are pursuing even higher-resolution analysis results from metrology tools. When results are provided with temporal information, one can add a new dimension to the results. This research involves the development of a new temporal electron source by utilizing tip enhancement, which necessitates the creation of a novel type of emitter that emits electrons on a femtosecond (fs) time scale. Due to the nature of the electron’s mass, under the influence of an electric field they move quickly. To achieve our goal is the design of a resonant nano antenna (or known as a nantenna) to produce field enhanced photoelectron emission. The benefits from this design include less damage (much less than 1 nJ) to the tip from the laser and a much smaller region of emission, if successful. This work will require knowledge of ultra-high vacuum systems, electron microscope usage and modification, ultra-fast lasers (alignment and mode-locking), Focused Ion Beam (FIB) milling at a high-resolution level, FDTD modeling of probe tips on the nanoscale, as well as many other techniques.