Document Type
Closed Project
Publication Date
Fall 2008
Instructor
Timothy Anderson
Course Title
Operations Research
Course Number
EMGT 540
Abstract
High-end digital still cameras rely on charge-coupled devices (CCDs) to provide a quality picture. The CCD is a two-dimensional sensor that collects photons and converts these to electrical charge. Today’s CCDs can easily contain over ten million bits of information. This large scope makes it impractical to read all the data out in parallel. Instead the data is passed out serially pixel-by-pixel and row-by-row. The circuitry required to sequence the data out consists of a number of clock drivers operating at various voltages. These clock drivers are broken into both horizontal and vertical clock drivers. Analog semiconductor companies develop these integrated circuits.
Rights
In Copyright. URI: http://rightsstatements.org/vocab/InC/1.0/ This Item is protected by copyright and/or related rights. You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you need to obtain permission from the rights-holder(s).
Persistent Identifier
http://archives.pdx.edu/ds/psu/23049
Citation Details
Colon, Rafeal; Combs, Trevor; Schweinfort, Willi; and Munkongsujarit, Songphon, "Vertical CCD Clock Driver Test Time Optimization" (2008). Engineering and Technology Management Student Projects. 1053.
http://archives.pdx.edu/ds/psu/23049
Comments
This project is only available to students, staff, and faculty of Portland State University