Document Type

Closed Project

Publication Date

Summer 2003

Course Number

EMGT 565/665

Abstract

Abstract

Yield variation is a source of constant investigation and improvement efforts in the semiconductor industry. Especially in the case of power MOSFET suppliers, margins dictate that even small yield improvement can be used as competitive advantages in the marketplace. Therefore, any useful technique to help yield managers to direct resources and analyze data should be considered. This paper evaluates the usefulness of multivariate statistical techniques aiming toward generation of insight that can be used to improve yields. Although many of the reported results are rather intuitive, some interesting findings are presented that may lead future work toward more significant improvement.

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In Copyright. URI: http://rightsstatements.org/vocab/InC/1.0/ This Item is protected by copyright and/or related rights. You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you need to obtain permission from the rights-holder(s).

Comments

This project is only available to students, staff, and faculty of Portland State University

Persistent Identifier

http://archives.pdx.edu/ds/psu/23919

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