Published In
Proceedings of SPIE
Document Type
Article
Publication Date
1-1-2012
Subjects
Charge coupled devices, Image processing -- Digital techniques, Imaging systems -- Image quality
Abstract
The depletion edge in Charge-Coupled Devices (CCD) pixels is dependent upon the amount of signal charge located within the depletion region. A model is presented that describes the movement of the depletion edge with increasing signal charge. This dynamic depletion edge is shown to have an effect on the amount of dark current produced by some pixels. Modeling the dark current behavior of pixels both with and without impurities over an entire imager demonstrates that this moving depletion edge has a significant effect on a subset of the pixels. Dark current collected by these pixels is shown to behave nonlinearly with respect to exposure time and additionally the dark current is affected by the presence of illumination. The model successfully predicts unexplained aspects of dark current behavior previously observed in some CCD sensors.
DOI
10.1117/12.909217
Persistent Identifier
http://archives.pdx.edu/ds/psu/9127
Citation Details
"Dynamic CCD pixel depletion edge model and the effects on dark current production," Justin C. Dunlap, M. M. Blouke, Erik Bodegom, Ralf Widenhorn, Proc. SPIE. 8298, 82980F (2012).
Description
Copyright 2012 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.