Sponsor
This research was funded by the US Department of Energy Basic Science Office under Contract No. DE-FG02- 10ER46406.
Published In
Physical Review B
Document Type
Article
Publication Date
5-13-2013
Subjects
Multiphoton processes, Multiphoton excitation microscopy, Near-field microscopy
Abstract
We report the observation of optical near fields in a photonic waveguide of conductive indium tin oxide (ITO) using multiphoton photoemission electron microscopy (PEEM). Nonlinear two-photon photoelectron emission is enhanced at field maxima created by interference between incident 410-nm and coherently excited guided photonic waves, providing strong phase contrast. Guided modes are observed under both transverse magnetic field (TM) and transverse electric field (TE) polarized illuminations and are consistent with classical electromagnetic theory. Implications on the role of multiphoton PEEM in optical near-field imaging are discussed.
DOI
10.1103/PhysRevB.87.205419
Persistent Identifier
http://archives.pdx.edu/ds/psu/9625
Citation Details
Fitzgerald, J. P. S., et al. "Photonic near-field imaging in multiphoton photoemission electron microscopy." Physical Review B 87.20 (2013): 205419.
Description
Copyright 2013 American Physical Society. The original instance can be found at http://link.aps.org/doi/10.1103/PhysRevB.87.205419