Published In

Proc. SPIE 6370, Nanomaterial Synthesis and Integration for Sensors, Electronics, Photonics, and Electro-Optics

Document Type

Conference Proceeding

Publication Date

2006

Subjects

Crystallography -- Data processing, Crystallography -- Databases -- Design and construction, Crystals -- Structure

Abstract

The crystallographic phase and morphology of many materials change with the crystal size so that new needs arise to determine the crystallography of nanocrystals. Direct space high-resolution phase-contrast transmission electron microscopy (HRTEM) and atomic resolution scanning TEM (STEM) when combined with tools for image-based nanocrystallography in two (2D) and three (3D) dimensions possess the capacity to meet these needs. After a concise discussion of lattice-fringe visibility spheres and maps, this paper discusses lattice-fringe fingerprinting in 2D and tilt protocol applications. On-line database developments at Portland State University (PSU) that support image-based nanocrystallography are also mentioned.

Description

Originally appeared in the Proceedings of SPIE 6370, Nanomaterial Synthesis and Integration for Sensors, Electronics, Photonics, and Electro-Optics in October 2006. The version of record may be found at http://dx.doi.org/10.1117/12.676656.

DOI

10.1117/12.676656

Persistent Identifier

http://archives.pdx.edu/ds/psu/16070

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