Sponsor
This work has benefitted from discussions with L. D. Marks, and indirectly from support by the U.S. Department of Energy and the Missouri Research Board, as well as by Monsanto and MEMC Electronic Materials Companies.
Published In
Journal of Applied Physics
Document Type
Article
Publication Date
2005
Subjects
Nanostructured materials, Nanotechnology, Transmission electron microscopes, Crystals -- Defects
Abstract
The orientation dependence of thin-crystal lattice fringes can be gracefully quantified using fringe-visibility maps, a direct-space analog of Kikuchi maps [Nishikawa and Kikuchi, Nature (London) 121, 1019 (1928)]. As in navigation of reciprocal space with the aid of Kikuchi lines, fringe-visibility maps facilitate acquisition of crystallographic information from lattice images. In particular, these maps can help researchers to determine the three-dimensional lattice of individual nanocrystals, to 'fringe-fingerprint' collections of randomly oriented particles, and to measure local specimen thickness with only a modest tilt. Since the number of fringes in an image increases with maximum spatial-frequency squared, these strategies (with help from more precise goniometers) will be more useful as aberration correction moves resolutions into the subangstrom range.
DOI
10.1063/1.2135414
Persistent Identifier
http://archives.pdx.edu/ds/psu/16077
Citation Details
Fraundorf, P., Wentao Qin, Peter Moeck, and Eric Mandell. "Making sense of nanocrystal lattice fringes." Journal of applied physics 98, no. 11 (2005): 114308.
Description
Originally appeared in Journal of Applied Physics, volume 98., and may be found at http://scitation.aip.org/content/aip/journal/jap/98/11/10.1063/1.2135414.
© 2005 American Institute of Physics