Document Type

Pre-Print

Publication Date

3-2008

Subjects

Nanostructured materials, Nanotechnology, Transmission electron microscopes, Crystals -- Identification, Condensed matter

Abstract

Two novel (and proprietary) strategies for the structural identification of a nanocrystal from either a single high-resolution (HR) transmission electron microscopy (TEM) image or a single precession electron diffraction pattern are proposed and their advantages discussed in comparison to structural fingerprinting from powder X-ray diffraction patterns. Simulations for cubic magnetite and maghemite nanocrystals are used as examples.

Description

This is an expanded and updated version of a conference paper that has been published in Suppl. Proc. of TMS 2008, 137th Annual Meeting & Exhibition, Volume 1, Materials Processing and Properties, pp. 25-32.

Persistent Identifier

http://archives.pdx.edu/ds/psu/16078

Share

COinS