Crystallite Phase and Orientation Determinations of (Mn, Ga) As/GaAs-crystallites using Analyzed (Precession) Electron Diffraction Patterns

Authors

Ines Häusler, Humboldt University of BerlinFollow
Stavros Nicolopoulos, NanoMEGAS SPRL
Edgar F. Rauch, SIMAP/GPM2 Laboratory
K. Volz, Philipps-University MarburgFollow
Peter Moeck, Portland State UniversityFollow

Sponsor

Financial support ws provided by Deutsche Forschungsgemeinschaft (DFG).

Published In

Proceedings of the Microscopy Conference (MC 2011)

Document Type

Presentation

Publication Date

2011

Subjects

Electrons -- Diffraction, Transmission electron microscopes, Crystallography, Nanocrystals

Abstract

Outline of the presentation:

1. Material system: (Mn,Ga)As/GaAs-crystallites

2. Structure analysis using Nano-beam Diffraction (NBD) Precession Electron Diffraction Technique (PED) --> Structure type I + II

3. Phase and orientation mapping using ASTAR

4. Conclusion

Description

PDF version of a presentation originally presented at the Microscopy Conference 2011 (MC2011) held at Christian-Albrechts-Universität zu Kiel, Kiel, Germany on August 28-September 2, 2011, and included in its proceedings.

Persistent Identifier

http://archives.pdx.edu/ds/psu/16105

Citation Details

Häusler, I., Niclopoulos, S., Rauch, E. F., Volz, K., & Moeck, P. (2011). Crystallite phase and orientation determinations of (Mn, Ga) As/GaAs-crystallites using analyzed (precession) electron diffraction patterns. In Proceedings of the Microscopy Conference (MC 2011).