Sponsor
This research was supported by the NSF through Grant No. BES-0086368.
Published In
Physical Review Letters
Document Type
Article
Publication Date
3-1-2003
Subjects
Nanostructured materials, Nanotubes, Raman spectroscopy
Abstract
We present near-field Raman spectroscopy and imaging of single isolated single-walled carbon nanotubes with a spatial resolution of approximately 25 nm. The near-field origin of the image contrast is confirmed by the measured dependence of the Raman scattering signal on tip-sample distance and the unique polarization properties. The method is used to study local variations in the Raman spectrum along a single single-walled carbon nanotube.
DOI
10.1103/PhysRevLett.90.095503
Persistent Identifier
http://archives.pdx.edu/ds/psu/7648
Citation Details
Hartschuh, A., Sánchez, E., Xie, X., & Novotny, L. (2003). High-resolution near-field Raman microscopy of single-walled carbon nanotubes. Physical Review Letters, 90(9), 095503.
Description
This is the publisher's final pdf. Article appears in Physical Review Letters (http://prl.aps.org/) and is copyrighted by APS Journals (http://publish.aps.org/).