Characterization of Dielectric Waveguides Through Photoemission Electron Microscopy (PEEM) in the Infrared Regime

Authors

Theodore Stedmark, Portland State UniversityFollow
Robert Campbell Word, Portland State UniversityFollow
Rolf Könenkamp, Portland State UniversityFollow

Published In

Microscopy and Microanalysis

Document Type

Citation

Publication Date

9-2015

Abstract

We report here, for the first time, the direct observation polarization dependent phase shifts in the in-coupling of light in the 780nm regime at the edge of a linear dielectric waveguide. Using finite element techniques, we show that these phase shifts are correctly predicted. Furthermore the obtained photoemission micrographs allow a determination of optical properties on the nanometer scale, i.e. optical near-field distributions can be quantified and energy transfer and loss can be analyzed. This opens the doors to sub-wavelength and dynamic imaging in metamaterial devices.

Paper No. 0793

Description

© Microscopy Society of America 2015

Locate the Document

https://doi.org/10.1017/S1431927615008727

Persistent Identifier

https://archives.pdx.edu/ds/psu/30253

Citation Details

Stenmark, T. A., Word, R. C., & Konenkamp, R. (2015). Characterization of Dielectric Waveguides Through Photoemission Electron Microscopy (PEEM) in the Infrared Regime. Microscopy and Microanalysis, 21(S3), 1589-1590.