Sponsor
This work is partially supported by NSF under grant number DBI-0352224.
Published In
Physics Procedia
Document Type
Article
Publication Date
8-2008
Subjects
Electron microscopy, Photoemission, Achromatism
Abstract
We report recent progress in the construction of a new aberration-corrected photoemission electron microscope. The correcting element in this instrument is a hyperbolic electron mirror which corrects for chromatic and spherical aberration. We present first images obtained with the new instrument and numerical results from trajectory and wave-optical calculations indicating that the resolution can be of the order of 1 nm.
Rights
Copyright © 2008 Published by Elsevier B.V.
This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Locate the Document
DOI
10.1016/j.phpro.2008.07.132
Persistent Identifier
https://archives.pdx.edu/ds/psu/30313
Citation Details
Könenkamp, R., Jones, T., Elstner, J., Word, R., Rempfer, G., Dixon, T., ... & Skoczylas, W. (2008). Image properties in an aberration-corrected photoemission electron microscope. Physics Procedia, 1(1), 505-511.