Information-Theory Based Symmetry Classifications of Sets of S/TEM Zone-Axis Images in Support of Nanocrystallography and Discrete Electron Tomography
Published In
Microscopy Society of America
Document Type
Citation
Publication Date
7-22-2023
Abstract
Both ordinary (translation periodic) crystals and quasicrystals possess anisotropic structures which need to be classified with respect to their symmetries at the atomic level. Well-chosen discrete sets of projections of these structures into two dimensions (2D) allow for tomographic reconstructions at atomic resolution [1]. Transmission electron goniometry [2,3] enables image-based nanocrystallography [3–6] and prospectively also discrete electron tomography at atomic resolution in both the scanning (S/) probe and parallel illumi-nation (phase contrast/electron-exit wave-reconstruction) modes of transmission electron microscopy (TEM). Figure 1 illustrates the transmission electron goniometry principle on a crystalline sample [4]. Manufactures and vendors of S/TEMs might be pleased to read that the idea of transmission electron goniometry goes back to German patents [6] that expired a long time ago. There is, however, significant room for improvements as far as specimen goniometers in S/TEMs are concerned [7,8].
Rights
© The Author(s) 2023
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DOI
10.1093/micmic/ozad067.289
Persistent Identifier
https://archives.pdx.edu/ds/psu/40756
Publisher
Oxford University Press
Citation Details
Moeck, P. (2023). Information-Theory Based Symmetry Classifications of Sets of S/TEM Zone-Axis Images in Support of Nanocrystallography and Discrete Electron Tomography.