Published In

Radar Symposium (IRS), 2015 16th International

Document Type

Citation

Publication Date

6-1-2015

Subjects

Surface roughness -- Measurement, Image processing -- Digital techniques

Abstract

Terahertz (THz) imaging has shown great potential for nondestructive evaluation (NDE) of a wide variety of manufactured products. Its ability to penetrate many non-polar dielectrics allows tomographic imaging of an object's 3D structure. The authors' previous work demonstrated the ability to produce 3D THz tomographic images of objects using a single data set collected in a 2D synthetic aperture configuration. This ability was recently expanded to allow imaging to within objects with curved boundaries by employing a split-step Fourier method to numerically back propagate the measured fields to the set of image planes that comprise the 3D tomographic image. This work presents new experimental results that demonstrate the split-step Fourier method's ability to correct for refraction and accurately quantify the thickness of a curved dielectric layer.

Rights

Copyright © 2015, IEEE

Description

Presented at the 2015 16th International Radar Symposium (IRS) in Dresden.

DOI

10.1109/IRS.2015.7226299

Persistent Identifier

http://archives.pdx.edu/ds/psu/20888

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