Memristor Testing Needs Compared to Existing CMOS Testing Methods

Authors

Rasika Joshi, Intel CorporationFollow
John M. Acken, Portland State UniversityFollow

Published In

2023 International Symposium on Signals, Circuits and Systems (ISSCS)

Document Type

Citation

Publication Date

7-13-2023

Abstract

This paper provides a comparison of established CMOS circuit testing concepts to the existing memristor testing efforts to identify memristor circuit testing needs. A very brief review of many CMOS testing concepts is provided to give a basis for comparison with memristor testing. A short simple overview of memristor theory precedes a survey of existing memristor testing efforts. Specifically, an analysis of testing sneak paths for fault detection and fault diagnosis is presented. A list of concepts that are equally applicable to both CMOS and memristor technologies have been described and those unique to memristor circuits have been identified.

Rights

© IEEE

Locate the Document

https://doi.org/10.1109/ISSCS58449.2023.10190937

DOI

10.1109/ISSCS58449.2023.10190937

Persistent Identifier

10190937

Publisher

IEEE

Citation Details

Joshi, R., & Acken, J. M. (2023, July). Memristor Testing Needs Compared to Existing CMOS Testing Methods. In 2023 International Symposium on Signals, Circuits and Systems (ISSCS) (pp. 1-6). IEEE.