Sponsor
Portland State University. Department of Electrical Engineering
First Advisor
Paul Van Halen
Date of Publication
6-2-1993
Document Type
Thesis
Degree Name
Master of Science (M.S.) in Electrical and Computer Engineering
Department
Electrical Engineering
Language
English
Subjects
Bipolar transistors -- Noise -- Measurement, Pascal (Computer program language)
DOI
10.15760/etd.6476
Physical Description
1 online resource (ix, 84 p.)
Abstract
First, the concepts of reflection coefficients, s-parameters, Smith chart, noise figure, and available power gain will be introduced. This lays out the foundation for the presentation of techniques on measuring noise figure and gain of high speed bipolar junction transistors. Noise sources in a bipolar junction transistor and an equivalent circuit including these noise sources will be presented. The process of determining the noise parameters of a transistor will also be discussed. A Pascal program and several TEKSPICE scripts are developed to calculate the stability, available power gain, and noise figure circles. Finally, these circles are plotted on a Smith chart to give a clear view of how a transistor will perform due to a change in source impedances.
Rights
In Copyright. URI: http://rightsstatements.org/vocab/InC/1.0/ This Item is protected by copyright and/or related rights. You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you need to obtain permission from the rights-holder(s).
Persistent Identifier
https://archives.pdx.edu/ds/psu/26602
Recommended Citation
Jung, Wayne Kan, "Measurement Techniques for Noise Figure and Gain of Bipolar Transistors" (1993). Dissertations and Theses. Paper 4592.
https://doi.org/10.15760/etd.6476
Comments
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