Diffraction-Pattern Sampling for Automatic Pattern Recognition
Published In
Proceedings of the IEEE
Document Type
Citation
Publication Date
1-1-1970
Abstract
This paper describes diffraction-pattern sampling as a basis for automatic pattern recognition in photographic imagery; it covers: Diffraction-pattern generation. diffraction-pattern/image-area relationships, diffraction-pattern sampling, algorithm development (using an interactive computer-graphic based facility), facility description, and experimental results which have been obtained over the last few years at General Motors’ AC Electronics-Defense Research Laboratories, Santa Barbara, Calif. Sampling the diffraction pattern results in a sample signature–a different one for each sampling geometry. The kinds of information obtainable from sample signatures are described, and considerations for developing algorithms based on such information are discussed. A tutorial section is included for the purpose of giving the reader an intuitive feeling for the kinds of information contained in a diffraction pattern and how it relates to the original photographic imagery. © 1970, IEEE. All rights reserved.
Locate the Document
DOI
10.1109/PROC.1970.7593
Persistent Identifier
https://archives.pdx.edu/ds/psu/37281
Citation Details
Lendaris, G. G., & Stanley, G. L. (1970). Diffraction-pattern sampling for automatic pattern recognition. Proceedings of the IEEE, 58(2), 198-216.
Description
At time of writing Professor Lendaris was affiliated with GM Research Lab.