Using Yield to Predict Long-term Reliability of Integrated Circuits: Application of Boltzmann-Arrhenius-Zhurkov Model

Authors

Ephraim Suhir, Portland State UniversityFollow
Zoran Stamenkovic, Leibniz-Institut für innovative Mikroelektronik

Published In

Solid-State Electronics

Document Type

Citation

Publication Date

2-1-2020

Abstract

Modified Boltzmann-Arrhenius-Zhurkov (BAZ) constitutive model is applied to predict the reliability of integrated circuits. The model accounts for the impact of physical defects and process variations on the stress-free activation energy, which is viewed as a critical material's property. It is shown that the probability of non-failure (reliability) and the corresponding mean-time-to-failure (MTTF) can be evaluated from the failure-oriented-accelerated-testing (FOAT) geared to the modified BAZ model. The general concept is illustrated by the experimental data.

Description

© 2019 Elsevier Ltd. All rights reserved.

Locate the Document

https://doi.org/10.1016/j.sse.2019.107746

DOI

10.1016/j.sse.2019.107746

Persistent Identifier

https://archives.pdx.edu/ds/psu/31048

Citation Details

Suhir, E., & Stamenkovic, Z. (2020). Using yield to predict long-term reliability of integrated circuits: Application of Boltzmann-Arrhenius-Zhurkov model. Solid-State Electronics, 164, 107746.