Demonstration of 40kV Diffraction of Graphite for Structural Analysis

Authors

Andrew Barnum, Portland State UniversityFollow
Jun Jiao, Portland State UniversityFollow

Published In

Microscopy and Microanalysis

Document Type

Citation

Publication Date

2015

Subjects

Graphite -- Testing

Abstract

Rapid structural assessment of newly synthesized nanomaterials is of tantamount importance both to exploratory researchers and industries seeking integration with consumer products. Most nanomaterials are susceptible to radiation damage during observation in the transmission electron microscope (TEM), causing propagation of dislocations, altering crystal phases, and destruction of the lattice structure through amorphization. Lowering the observation voltage in the TEM can result in less damage, though at the expense of decreased resolution, for many nanomaterials [1]. For microscopes not equipped with aberration correctors, such as the Tecnai F­20 used here, an information space roughly equivalent to 200kV operation can be achieved at 40kV through diffraction, greatly increasing the length of time for observation and the certainty of the observed structural details.

Description

Copyright © Microscopy Society of America 2015

DOI

10.1017/S1431927615002561

Persistent Identifier

http://archives.pdx.edu/ds/psu/20927

Citation Details

Barnum, A., & Jiao, J. (2015). Demonstration of 40kV TEM Diffraction of Graphite for Structural Analysis. Microscopy and Microanalysis, 21(S3), 353-354.