Published In
Journal of Materials Science: Materials in Electronics
Document Type
Article
Publication Date
3-2016
Subjects
Ball grid array technology, Optical materials -- Technological innovations, Microelectronic packaging -- Materials
Abstract
There is an obvious incentive for using bow-free (temperature change insensitive) assemblies in various areas of engineering, including electron device and electronic packaging fields. The induced stresses in a bow-free assembly could be, however, rather high, considerably higher than in an assembly, whose bow is not restricted. The simplest and trivial case of a bow-free assembly is a tri-component body, in which the inner component is sandwiched between two identical outer components (“mirror” structure), is addressed in our analysis, and a simple and physically meaningful analytical stress model is suggested. It is concluded that if acceptable stresses (below yield stress of the solder material) are achievable, a mirror (bow-free, temperature-change-insensitive) design should be preferred, because it results in an operationally stable performance of the system.
DOI
10.1007/s10854-015-4042-8
Persistent Identifier
http://archives.pdx.edu/ds/psu/17012
Citation Details
Suhir, E., Ghaffarian, R., and Nicolics, J. (2016). Predicted Stresses in Ball-Grid-Array (BGA) and Column-Grid-Array (CGA) Interconnections in a Mirror-Like Package Design. Journal of Materials Science: Materials in Electronics, Volume 27, Issue 3, pp 2430-2441.
Description
This work was authored as part of the Contributor's official duties as an Employee of the United States Government and is therefore a work of the United States Government. In accordance with 17 U.S.C. 105, no copyright protection is available for such works under U.S. Law. This is the publisher’s final pdf. The published article is copyrighted by Springer Science+Business Media and can be found at: http://dx.doi.org/10.1007/s10854-015-4042-8